Clare HIPOT Testing

Safe

HIPOT Testing

from Clare
The Horizon II, the latest generation of wiring analyser from Clare Instruments, incorporates several new features and capabilities which extend its range beyond validation testing of cables, connectors and harnesses up to 1500 DC/1067V AC.

The all-in-one high voltage wiring analyser meets the requirement for an easy-to-use, fully integrated and flexible data management tool offering virtually unlimited data storage and reporting capabilities.

A new label printing capability allows the user to control fonts, logo, columns, barcode serialisation and user-defined fields such as test results, custom strings, product name, date/time, operator ID, batch/lot no.

Remote control via TCPIP (internet) allows the instrument to be server-controlled so that test information and results are stored, launched and printed from a central server, while a remote desktop capability allows test engineers to access it from a PC using Windows standard networking setup.

An expanded I/O (up to 11) for use in an integrated PLC-controlled assembly environment enables Horizon to become a ‘slave’ to an automated process or system where multiple I/O is needed for ‘start’, ‘stop’ ‘pass’, ‘fail’, ‘re-test’, ‘select test’, ‘pause/continue’ and other control commands.

A text-to-speech capability allows Horizon to ‘speak’ to an operator by calling out test status (pass/fail) and operator instructions while an enhanced serial number generation capability through user-defined scripts eliminates conventional restrictions tied to alfa-numeric only serial number generation methods

Product features a powerful built-in PC with flash memory and comes with three standard I/0 and a facility to add a further eight for a total of 11 I/0.

Up to 128-point testing can be carried out with the Horizon II while the product’s versatility enables expansion up to 1024 points, with the capability of switching 1A and HiPot testing up to 1500v DC and/or 1067V AC. It also performs advanced parametric tests such as measurement of passive components and semi active components such as varistors, thyristors, MOVs, zeners and relays.

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